安捷倫科技有限公司（NYSE: A）于當(dāng)天宣布推出一個(gè)用于OBSAI的完整的連接測(cè)試解決方案，支持控制點(diǎn)3，RP3-01，控制點(diǎn)1以及用在基站架構(gòu)中BaseBand子系統(tǒng)和Radiohead子系統(tǒng)的以太網(wǎng)界面。這對(duì)于OBSAI互連器來(lái)說(shuō)是一個(gè)非常可靠的鏈接解決方案。其加速了軟硬件的調(diào)試功能，同時(shí)并減少了互用性測(cè)試時(shí)間，使市場(chǎng)可極早地提供基于OBSAI的系統(tǒng)。 基站中位于系統(tǒng)之間的標(biāo)準(zhǔn)高速光電互連器的出現(xiàn)，正在推動(dòng)著在調(diào)試程序和測(cè)試方法方面的改變，互相協(xié)同性與大量的測(cè)試也變得越來(lái)越重要。此外，在測(cè)試期間，所有子系統(tǒng)在測(cè)試時(shí)間可以不顯示，這對(duì)于仿效缺失設(shè)備變得非常重要，以保證在測(cè)試下的合適操作。 安捷倫測(cè)試平臺(tái)提供了多波段激勵(lì)和帶有結(jié)構(gòu)解碼功能的實(shí)時(shí)分析性能，用于廣泛的鏈路層測(cè)試。這些性能加快了通過(guò)提供二進(jìn)制層和結(jié)構(gòu)層功能的發(fā)展，用于測(cè)試矢量產(chǎn)生的分級(jí)協(xié)議顯示器和自動(dòng)化工具，允許用戶執(zhí)行有效地仿效、事故檢修和檢驗(yàn)設(shè)計(jì)。 由于可靠性對(duì)基點(diǎn)來(lái)說(shuō)至關(guān)重要，所以使每一個(gè)帶有高可靠性測(cè)試設(shè)備的子系統(tǒng)功能生效也非常重要。為了最大化測(cè)量結(jié)果的精確性和可靠性，除在市場(chǎng)上與關(guān)鍵設(shè)備生產(chǎn)商親密合作，安捷倫已經(jīng)使重要的子系統(tǒng)得以確認(rèn)。安捷倫基點(diǎn)鏈接測(cè)試模塊結(jié)合錯(cuò)誤觸發(fā)和錯(cuò)誤發(fā)生計(jì)算報(bào)告在多通道上給出了精確的錯(cuò)誤注射性能。 自從OBSAI架構(gòu)以模塊形式出現(xiàn)并且可升級(jí)，對(duì)于測(cè)試環(huán)境來(lái)說(shuō)關(guān)鍵設(shè)備之一就是提供相同程度的可測(cè)量性。由于安捷倫平臺(tái)有模塊架構(gòu)，測(cè)試環(huán)境才可被擴(kuò)展以適應(yīng)子系統(tǒng)測(cè)試需求。此外，基于軟件環(huán)境的邏輯分析儀可幫助每個(gè)用戶根據(jù)他們自己的測(cè)試需求進(jìn)行定制。 安捷倫數(shù)字化測(cè)試部副總裁兼總經(jīng)理Sigi Gross說(shuō)：“該解決方案的推出闡明了安捷倫承諾的利用他們?cè)谶壿?、連續(xù)協(xié)議和網(wǎng)絡(luò)測(cè)試方面的專門技術(shù)，幫助我們的用戶向帶有新組套工具的數(shù)字化技術(shù)轉(zhuǎn)換移動(dòng)設(shè)備?！? [FONT=times] original text [/FONT] [font=times] Agilent Technologies Introduces Most Reliable Link Test Solution for OBSAI Standard Interconnects [/font] [font=times][Color=#708090]Agilent Technologies Inc. （NYSE: A） today announced a complete link test solution for Open Base Station Architecture Initiative （OBSAI） interconnects, supporting Reference Point 3, RP3-01, Reference Point 1, and Ethernet Interfaces used between the BaseBand subsystem and Radiohead subsystems within a base station architecture. This is the most reliable link test solution for OBSAI interconnects. It accelerates hardware and software debug, and reduces interoperability testing time, enabling earlier availability of OBSAI-based systems in the market. The emergence of standard high-speed electrical and optical, protocol-based interconnects between subsystems in base stations is driving changes in the debug and test methodologies; interoperability and robust testing are becoming increasingly important. In addition, as all subsystems may not be present during the test time, it becomes crucial to emulate missing devices to ensure proper operation of the device under test. Agilent‘s test platform provides multichannel stimulus and real-time analysis capabilities with frame decoding for extensive link layer test. These capabilities accelerate development by providing bit-level to frame-level functionality, hierarchical protocol display and automated tools for test-vector generation that allow users to efficiently emulate, troubleshoot and verify designs. Because reliability is essential for base stations, it is critical to validate the performance of each subsystem with test equipment that has a high level of reliability. To maximize the accuracy and dependability of the measurement results, Agilent has performed intensive subsystem validation in addition to working closely with the key equipment manufacturers in the marketplace. The Agilent base station link test module provides deterministic error injection capabilities on multiple channels combined with error-triggering and error-occurrence counting reports. Since OBSAI architectures are modular and scalable, one of the key requirements for the test environment is to offer the same degree of scalability. Thanks to the modular architecture of the Agilent platform, the test environment can be extended to fit exactly with the subsystem‘s test needs. Moreover, the logic analyzer-based software environment helps each user customize the views according to his or her own test needs. "The introduction of this solution illustrates Agilent‘s commitment to use its expertise in logic, serial protocol and network test to help our customers transform mobile device architectures to digital technologies with a new set of tools that are well integrated into the wireless use model," said Sigi Gross, vice president and general manager of Agilent‘s Digital Test Division. [/color][/font]